Methods exploited in our group:
- Near-field Scanning Optical Microscopy
- Atomic Force Microscopy
- static and dynamic Secondary Ion Mass Spectroscopy (SIMS)
- X ray Photoelectron Spectroscopy (XPS)
- Fluorescence Microscope
- White Light Reflectance Spectroscopy (WLRS)
- Drop Shape Analysis System
- Film Deposition and Soft Lithography
- Environmental Chamber
Near-field Scanning Optical Microscopy

Atomic Force Microscopy

static and dynamic Secondary Ion Mass Spectroscopy (SIMS)
X ray Photoelectron Spectroscopy (XPS)

new TOF-SIMS system

Fluorescence Microscope

White Light Reflectance Spectroscopy (WLRS)

Drop Shape Analysis System

Film Deposition / Soft Lithography
