Methods exploited in our group:

  • Near-field Scanning Optical Microscopy
  • Atomic Force Microscopy
  • static and dynamic Secondary Ion Mass Spectroscopy (SIMS)
  • X ray Photoelectron Spectroscopy (XPS)
  • Fluorescence Microscope
  • White Light Reflectance Spectroscopy (WLRS)
  • Drop Shape Analysis System
  • Film Deposition and Soft Lithography
  • Environmental Chamber

 

Near-field Scanning Optical Microscopy
   

 

Atomic Force Microscopy
     

 

static and dynamic Secondary Ion Mass Spectroscopy (SIMS)
X ray Photoelectron Spectroscopy (XPS)
     

   

new TOF-SIMS system
     

 

Fluorescence Microscope
 

 

White Light Reflectance Spectroscopy (WLRS)
 

 

Drop Shape Analysis System
   

 

Film Deposition / Soft Lithography
   

 

Environmental Chamber